Advanced Photon Source | Center for Nanoscale Materials

Office of Science User Facilities

SPECS-TII, Inc.

SPECS manufactures cutting-edge systems and components for surface analysis in UHV, based on methods like XPS, UPS, AES, ISS, STM, LEEM/PEEM, LEED, SIMS, SNMS and HREELS. We offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers, monochromators and research microscopes like LEEM and STM. A strong focus of our work is on customized systems combining thin film preparation (MBE) with spectroscopic and microscopic options.

20 Cabot Blvd. Suite 300

Mansfield MA 02048

USA

 

Tel: 
508-618-1292
Fax: 
508-618-1334
Booth: 
48